A hybrid evaluation scheme for EHL film thickness determination is proposed and discussed. The film thickness profile in the contact region is measured using interferograms produced with a novel multi channel interferometry method. Since the refractive index distribution in the contact is pressure-dependent, and the initial film thickness profile will be evaluated assuming atmospheric pressure, a refractive index correction scheme is employed. The correction scheme is based on the Lorenz-Lorentz equation and a pressure-density relation together with a numerical pressure solver taking the initial film thickness measurement as input. The film thickness determination scheme is applied to an interesting phenomenon that can be observed at sliding conditions when the discrepancy occurred in the form of a deep and large dimple in the conjunction. Such a dimple appeared instead of the conventional plateau. The phenomenon was studied under different degrees of sliding. The detailed film thickness maps and pressure distributions for highly loaded EHL conjunctions at high degrees of sliding are produced using a hybrid evaluation scheme. The results are analyzed and discussed. [S0742-4787(00)00301-5]
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January 2000
Technical Papers
A Hybrid Film Thickness Evaluation Scheme Based on Multi-Channel Interferometry and Contact Mechanics
J. Lord,
J. Lord
Division of Machine Elements, Lulea˚ University of Technology, SE-971 87 Lulea˚, Sweden
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A. Jolkin,
A. Jolkin
Division of Machine Elements, Lulea˚ University of Technology, SE-971 87 Lulea˚, Sweden
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R. Larsson,
R. Larsson
Division of Machine Elements, Lulea˚ University of Technology, SE-971 87 Lulea˚, Sweden
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O. Marklund
O. Marklund
Division of Industrial Electronics, Lulea˚ University of Technology, SE-971 87 Lulea˚, Sweden
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J. Lord
Division of Machine Elements, Lulea˚ University of Technology, SE-971 87 Lulea˚, Sweden
A. Jolkin
Division of Machine Elements, Lulea˚ University of Technology, SE-971 87 Lulea˚, Sweden
R. Larsson
Division of Machine Elements, Lulea˚ University of Technology, SE-971 87 Lulea˚, Sweden
O. Marklund
Division of Industrial Electronics, Lulea˚ University of Technology, SE-971 87 Lulea˚, Sweden
Contributed by the Tribology Division of THE AMERICAN SOCIETY OF MECHANICAL ENGINEERS and presented at the STLE/ASME Tribology Conference, Orlando, FL, October 10–13, 1999. Manuscript received by the Tribology Division March 5, 1999; revised manuscript received June 29, 1999. Paper No. 99-Trib-42. Associate Technical Editor: M. D. Bryant.
J. Tribol. Jan 2000, 122(1): 16-22 (7 pages)
Published Online: June 29, 1999
Article history
Received:
March 5, 1999
Revised:
June 29, 1999
Citation
Lord , J., Jolkin , A., Larsson , R., and Marklund , O. (June 29, 1999). "A Hybrid Film Thickness Evaluation Scheme Based on Multi-Channel Interferometry and Contact Mechanics ." ASME. J. Tribol. January 2000; 122(1): 16–22. https://doi.org/10.1115/1.555324
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