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Keywords: thin films
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Publisher: ASME
Article Type: Research Papers
J. Eng. Mater. Technol. July 2010, 132(3): 031003.
Published Online: June 15, 2010
..., ω is the incident beam angle to the surface, β is the angle of diffraction beam to the surface, and R x is the intensity of the diffraction beam between infinite thickness and thin film sample (0.935 is the most common value used ( 32 )). By substituting each value in Eqs. 1 , 2...
Journal Articles
Publisher: ASME
Article Type: Research Papers
J. Eng. Mater. Technol. April 2010, 132(2): 021001.
Published Online: January 12, 2010
...Thao D. Nguyen; J. D. Yeager; D. F. Bahr; D. P. Adams; N. R. Moody Nanoindentation is widely used to characterize the mechanical and interfacial properties of thin film systems. However, the effects of substrate compliance on the indentation response of compliant substrate systems are not well...
Journal Articles
Publisher: ASME
Article Type: Predictive Science And Technology In Mechanics And Materials
J. Eng. Mater. Technol. October 2009, 131(4): 041208.
Published Online: September 1, 2009
... of theoretical frameworks, assessment of model predictive capabilities, and discovery of new physical phenomena. 24 02 2009 10 06 2009 01 09 2009 carbon nanotubes design of experiments elasticity micromechanical devices microswitches nanowires plasticity thin films...
Journal Articles
Journal Articles
Publisher: ASME
Article Type: Research Papers
J. Eng. Mater. Technol. April 2006, 128(2): 225–233.
Published Online: June 21, 2005
...Ken Gall; Yiping Liu; Dmitri Routkevitch; Dudley S. Finch We examine the mechanical behavior of anodic alumina thin films with organized nanometer-scale porosity. The cylindrical pores in the alumina film are arranged perpendicular to the film thickness in a near-perfect triangular lattice...
Journal Articles
Publisher: ASME
Article Type: Special Section On Nanomaterials And Nanomechanics
J. Eng. Mater. Technol. October 2005, 127(4): 451–456.
Published Online: February 22, 2005
...Yong Gan; Dongyun Lee; Xi Chen; Jeffrey W. Kysar Nanocomposite thin films which consist of 50 nm Al 2 O 3 nanoparticles in a copper metal matrix were deposited on a silicon wafer. The thickness of the nanocomposite thin films was about 3 microns and the volume density of the nanoparticles...
Journal Articles
Publisher: ASME
Article Type: Technical Papers
J. Eng. Mater. Technol. January 2005, 127(1): 33–39.
Published Online: February 22, 2005
..., Cambridge. Huang , M. , Suo , Z. , and Ma , Q. , 2002 , “ Plastic ratcheting induced cracks in thin film structures ,” J. Mech. Phys. Solids , 50 , pp. 1079 – 1098 . Ko¨nig, J. A., 1987, Shakedown of Elastic-Plastic Structures , Warszawa, PWN-Polish Scientific Publishers...
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