.... By changing the material properties of the struts, the models can be modified for use with other open-cell metallic foams. 28 10 2010 11 10 2011 21 12 2011 21 12 2011 atomic force microscopy beams (structures) bending strength cracks densification density elasticity...

... and atomic force microscopy. The role of microstructure and composition in altering both the mechanical and shape memory properties of the films is discussed. 22 06 2009 01 07 2010 20 09 2010 20 09 2010 annealing atomic force microscopy metallic thin films nanoindentation...

...Michael Chandross; Christian D. Lorenz; Mark J. Stevens; Gary S. Grest Nanofabrication using arrays of modified atomic force microscopy (AFM) tips can drastically reduce feature sizes and increase data storage densities. Additionally, AFM experiments are valuable tools for characterizing...

... that converges to a chisel edge, with plenty of material supporting the cutting edge, as apposed to a pointed tip. 18 02 2009 21 01 2010 26 05 2010 26 05 2010 atomic force microscopy cutting tools geometry micromachining wear Grooves with submicron depths can...

... Zheng , J. , Chen , Z. , and Liu , Z. , 2000 , “ Atomic Force Microscopy-Based Nanolithography on Silicon Using Colloidal Au Nanoparticles as a Nanooxidation Mask ,” Langmuir 0743-7463 , 16 ( 24 ), pp. 9673 – 9676 . 10.1021/la000705e Watkins , A. N. I. J. L. , and Jordan...

...Santiago D. Solares; Gaurav Chawla We present an overview of four types of imaging artifacts that can occur during characterization of sharp sample topographies with intermittent contact atomic force microscopy (AFM) when using short nanotube probes ( < 100 nm in length). We discuss the causes...

... for the fabrication of nanostructured components in polymer that relies on a simple and cost-effective master making technology. In particular, atomic force microscopy scratching is employed as an alternative technique for nanostructuring replication masters for microinjection molding. The conducted experimental...

...F. Marinello; S. Carmignato; A. Voltan; E. Savio; L. De Chiffre This paper aimed at identifying the error sources that occur in dimensional measurements performed using atomic force microscopy. In particular, a set of characterization techniques for errors quantification is presented...

... source and an integrated atomic force microscopy (AFM) probe tip, has been developed to improve the current plasma apparatus design. The miniature microwave plasma discharge applicator is capable of creating a miniature plasma stream with a diameter ranging from 2 mm down to micrometers. Hence...

... be removed with a rate of several tens to hundreds of nanometers in ductile mode, and the cantilever shows superior wear resistance. The experiments demonstrate successful nanomachining of single-crystal silicon. 02 03 2005 23 11 2005 nanotechnology machining atomic force microscopy...

...Jeong Woo Park; Noritaka Kawasegi; Noboru Morita; Deug Woo Lee The TNL (Tribo Nanolithography) method in aqueous solution uses the atomic force microscopy as a machining tool for the nanoscale fabrication of silicon. A specially designed cantilever with a diamond tip allows the formation of oxide...

.... The ablation products, swept away by an argon flow and collected in the distilled water, were further purified to result in a yield of 50%. The growth rate of purified aggregate ranged from 0.5 to 2 g ∕ h depending on the laser power. Microscopic scanning electron microscopy, atomic force microscopy...

... December 2000 01 March 2002 15 04 2003 atomic force microscopy Young's modulus indentation grinding etching manufacturing processes We measured the nano-hardness of a burn layer on 4340 steel surface utilizing a taper-sectioning procedure that amplified the thickness...

... by the direct-writing mode. Scanning electron and atomic force microscopy analysis revealed that the holes are in the range 0.65–100 μm and are free from taper. In addition, there was little recast layer around the holes. The damage threshold was approximately 4 J/cm 2 , which is smaller than those obtained...