In order to improve upon the inconvenient and complicated contemporary analytic techniques employed for optical systems, this paper investigates two important optical topics: (1) the determination of light ray paths and (2) sensitivity analysis of light path parameters with respect to the light source location for occasions when light rays cross medium boundary surfaces. To this end, the traditional laws of reflection and refraction are reformulated in terms of revolution geometry. This results in a set of laws much simpler than the original, suitable for use in mathematical modeling to determine light paths and system sensitivity from location of the light source, optical component location, the equation of the optical component’s surface curve, and the refractive index. Ray tracing and sensitivity analysis of the two most popular boundary surfaces, flat and spherical, are presented as examples. In order to illustrate experimentally the integration of these boundary surfaces into optical systems, an optical measurement system for measuring surface height and orientation, containing a beam splitter and a bi-convex lens, was built. Agreement between the experimental optical system’s performance and the theoretical predictions yielded by the proposed method are excellent. [S1087-1357(00)01501-X]
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Skew Ray Tracing and Sensitivity Analysis of Geometrical Optics
Psang Dain Lin, Professor,
Psang Dain Lin, Professor
National Cheng Kung University, Department of Mechanical Engineering, Tainan, Taiwan 70101, R.O.C.
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Te-tan Liao, Graduate student
Te-tan Liao, Graduate student
National Cheng Kung University, Department of Mechanical Engineering, Tainan, Taiwan 70101, R.O.C.
Search for other works by this author on:
Psang Dain Lin, Professor
National Cheng Kung University, Department of Mechanical Engineering, Tainan, Taiwan 70101, R.O.C.
Te-tan Liao, Graduate student
National Cheng Kung University, Department of Mechanical Engineering, Tainan, Taiwan 70101, R.O.C.
Contributed by the Manufacturing Engineering Division for publication in the JOURNAL OF MANUFACTURING SCIENCE AND ENGINEERING. Manuscript received November 1998; revised May 1999. Associate Technical Editor: E. C. DeMeter.
J. Manuf. Sci. Eng. May 2000, 122(2): 338-349 (12 pages)
Published Online: May 1, 1999
Article history
Received:
November 1, 1998
Revised:
May 1, 1999
Citation
Lin, P. D., and Liao, T. (May 1, 1999). "Skew Ray Tracing and Sensitivity Analysis of Geometrical Optics ." ASME. J. Manuf. Sci. Eng. May 2000; 122(2): 338–349. https://doi.org/10.1115/1.538924
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