Point Laser Triangulation (PLT) probes are relatively new noncontact probes being integrated with Coordinate Measuring Machines (CMMs). Two prominent advantages of PLT probes are fast measuring speeds (typically 100 to 1000 times faster than touch probes) and no contact force is required to take measurements making soft or fragile objects measurable. These advantages have motivated the integration of PLT probes onto CMM. However, because the PLT probe is an electro-optics device, many factors related to optics affect its operation, such as sensor-to-surface orientation and surface reflectivity. To study and better understand these error sources, PLT probe models are needed to simulate observed measurement errors. This article presents a new PLT probe model, which simulates observed measurement errors and shows the effects of placement and orientation of internal components. This PLT probe model is a combination of internal component models developed using geometrical optics. The model successfully simulates measurement errors from specular reflection observed experimentally with real PLT probes. The model also allows the parameters of internal components to be studied.
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November 1998
Research Papers
Accuracy Analysis of Point Laser Triangulation Probes Using Simulation
K. B. Smith,
K. B. Smith
Brigham Young University, Dept. of Electrical and Computer Engineering, Provo, UT 84602
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Y. F. Zheng
Y. F. Zheng
The Ohio State University, Dept. of Electrical Engineering, Columbus, OH 43210
Search for other works by this author on:
K. B. Smith
Brigham Young University, Dept. of Electrical and Computer Engineering, Provo, UT 84602
Y. F. Zheng
The Ohio State University, Dept. of Electrical Engineering, Columbus, OH 43210
J. Manuf. Sci. Eng. Nov 1998, 120(4): 736-745 (10 pages)
Published Online: November 1, 1998
Article history
Received:
January 1, 1997
Revised:
June 1, 1997
Online:
January 23, 2008
Citation
Smith, K. B., and Zheng, Y. F. (November 1, 1998). "Accuracy Analysis of Point Laser Triangulation Probes Using Simulation." ASME. J. Manuf. Sci. Eng. November 1998; 120(4): 736–745. https://doi.org/10.1115/1.2830214
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