...R. Kathiravan; Ravi Kumar; Akhilesh Gupta; Ramesh Chandra Copper nanoparticles with an average size of 10 nm are prepared by the sputtering method and are characterized using different techniques, viz., X-ray diffraction spectrum, atomic force microscopy, and transmission electron microscopy...

... generated using a radiometric, direct emission measurement method. The oxide was grown on a very clean, smooth, and mirror-like copper surface, heated in air at 700 ° C until emission measurements became constant ( 270 h ) . X-ray diffraction and EDS analyses were performed to characterize the spatial...