Pulsed thermography is an effective technique for quantitative prediction of defect depth within a specimen. Several methods have been reported in the literature. In this paper, using an analysis based on a theoretical one-dimensional solution of pulsed thermography, we analyzed four representative methods. We show that all of the methods are accurate and converge to the theoretical solution under ideal conditions. Three methods can be directly used to predict defect depth. However, because defect features that appear on the surface during a pulsed thermography test are always affected by three-dimensional heat conduction within the test specimen, the performance and accuracy of these methods differs for defects of various sizes and depths. This difference is demonstrated and evaluated from a set of pulsed thermography data obtained from a specimen with several flat-bottom holes as simulated defects.
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Analysis of Pulsed Thermography Methods for Defect Depth Prediction
J. G. Sun
J. G. Sun
Argonne National Laboratory
, 9700 South Cass Avenue, Argonne, IL 60439
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J. G. Sun
Argonne National Laboratory
, 9700 South Cass Avenue, Argonne, IL 60439J. Heat Transfer. Apr 2006, 128(4): 329-338 (10 pages)
Published Online: October 24, 2005
Article history
Received:
May 23, 2005
Revised:
October 24, 2005
Citation
Sun, J. G. (October 24, 2005). "Analysis of Pulsed Thermography Methods for Defect Depth Prediction." ASME. J. Heat Transfer. April 2006; 128(4): 329–338. https://doi.org/10.1115/1.2165211
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