Measurement of the thermal boundary conductance (TBC) by use of a nondestructive optical technique, transient thermoreflectance (TTR), is presented. A simple thermal model for the TTR is presented with a discussion of its applicability and sensitivity. A specially prepared sample series of Cr, Al, Au, and Pt on four different substrates (Si, sapphire, GaN, and AlN) were tested at room temperature and the TTR signal fitted to the thermal model. The resulting TBC values vary by more than a factor of 3 0.71×108-2.3×108 W/m2 K. It is shown that the diffuse mismatch model (DMM) tended to overpredict the TBC of interfaces with materials having similar phonon spectra, while underpredicting the TBC for interfaces with dissimilar phonon spectra. The DMM only accounts for diffuse elastic scattering. Other scattering mechanisms are discussed which may explain the failure of the DMM at room temperature.

Issue Section:
Radiative Heat Transfer
Keywords:
chromium, aluminium, gold, platinum, metallic thin films, thermoreflectance, phonon spectra, thermal conductivity, thermal diffusivity
Topics:
Electrical conductance, Metallic films, Metals, Phonons, Sapphire, Spectra (Spectroscopy), Temperature, Thermal conductivity, Thermoreflectance, Top-tensioned risers, Transients (Dynamics), Reflectance, Gallium nitride, Electromagnetic scattering
1.
Mahan
,
G. D.
, and
Woods
,
L. M.
,
1998
, “
Multilayer Thermionic Refrigeration
,”
Phys. Rev. Lett.
,
80
, pp.
4016
–
4019
.
2.
da Silva, L. W., and Kaviany, M., 2002, “Miniaturized Thermoelectric Cooler,” Proc. 2002 ASME International Mechanical Engineering Congress and Exposition, ASME, New York, pp. IMECE2002-32437 1–15.
3.
Phelan
,
P. E.
,
1998
, “
Application of Diffuse Mismatch Theory to the Prediction of Thermal Boundary Resistance in Thin-Film High-Tc Superconductors
,”
ASME J. Heat Transfer
,
120
, pp.
37
–
43
.
4.
Phelan
,
P. E.
,
Song
,
Y.
,
Nakabeppu
,
O.
,
Ito
,
K.
,
Hijikata
,
K.
,
Ohmori
,
T.
, and
Torikoshi
,
K.
,
1994
, “
Film/Substrate Thermal Boundary Resistance for an Er–Ba–Cu–O High-Tc Thin Film
,”
ASME J. Heat Transfer
,
116
, pp.
1038
–
1041
.
5.
Filippov
,
K. A.
, and
Balandin
,
A. A.
,
2003
, “
The Effect of the Thermal Boundary Resistance on Self-Heating of AlGaN/GaN HFETs
,”
MRS Internet J. Nitride Semicond. Res.
,
8
, pp.
1
–
4
.
6.
Kim
,
E.-K.
,
Kwun
,
S.-I.
,
Lee
,
S.-M.
,
Seo
,
H.
, and
Yoon
,
J.-G.
,
2000
, “
Thermal Boundary Resistance at Ge2Sb2Te5/ZnS:SiO2 Interface
,”
Appl. Phys. Lett.
,
76
, pp.
3864
–
3866
.
7.
Swartz
,
E. T.
, and
Pohl
,
R. O.
,
1989
, “
Thermal Boundary Resistance
,”
Rev. Mod. Phys.
,
61
, pp.
605
–
668
.
8.
Little
,
W. A.
,
1959
, “
The Transport of Heat Between Dissimilar Solids at Low Temperatures
,”
Can. J. Phys.
,
37
, pp.
334
–
349
.
9.
Swartz
,
E. T.
, and
Pohl
,
R. O.
,
1987
, “
Thermal Resistance at Interfaces
,”
Appl. Phys. Lett.
,
51
, pp.
2200
–
2202
.
10.
Young
,
D. A.
, and
Maris
,
H. J.
,
1989
, “
Lattice-Dynamical Calculation of the Kapitza Resistance Between fcc Lattices
,”
Phys. Rev. B
,
40
, pp.
3685
–
3693
.
11.
Stoner
,
R. J.
, and
Maris
,
H. J.
,
1993
, “
Kapitza Conductance and Heat Flow Between Solids at Temperatures From 50 to 300 K
,”
Phys. Rev. B
,
48
, pp.
16373
–
16387
.
12.
Pettersson
,
S.
, and
Mahan
,
G. D.
,
1990
, “
Theory of the Thermal Boundary Resistance Between Dissimilar Lattices
,”
Phys. Rev. B
,
42
, pp.
7386
–
7390
.
13.
Kechrakos
,
D.
,
1991
, “
The Role of Interface Disorder in Thermal Boundary Conductivity Between Two Crystals
,”
J. Phys.: Condens. Matter
,
3
, pp.
1443
–
1452
.
14.
Fagas
,
G.
,
Kozorezov
,
A. G.
,
Lambert
,
C. J.
, and
Wigmore
,
J. K.
,
1999
, “
Lattice-Dynamical Calculation of Phonon Scattering at a Disordered Interface
,”
Physica B
,
263–264
, pp.
739
–
741
.
15.
Cahill
,
D. G.
,
Ford
,
W. K.
,
Goodson
,
K. E.
,
Mahan
,
G. D.
,
Majumdar
,
A. M.
,
Humphrey
,
J.
,
Merlin
,
R.
, and
Phillpot
,
S. R.
,
2003
, “
Nanoscale Thermal Transport
,”
J. Appl. Phys.
,
93
, pp.
793
–
818
.
16.
Rosencwaig
,
A.
,
Opsal
,
J.
,
Smith
,
W. L.
, and
Willenborg
,
D. L.
,
1985
, “
Detection of Thermal Waves Through Optical Reflectance
,”
Appl. Phys. Lett.
,
46
, pp.
1013
–
1015
.
17.
Pottier
,
L.
,
1994
, “
Micrometer Scale Visulatization of Thermal Waves by Photoreflectance Microscopy
,”
Appl. Phys. Lett.
,
64
, pp.
1618
–
1619
.
18.
Li
,
B.
, and
Zhang
,
S.
,
1997
, “
The Effect of Interface Resistances on Thermal Wave Propagation in Multilayered Samples
,”
J. Phys. D
,
30
, pp.
1447
–
1454
.
19.
Li
,
B.
,
Roger
,
J. P.
,
Pottier
,
L.
, and
Fournier
,
D.
,
1999
, “
Complete Thermal Characterization of Film-on-Substrate System by Modulated Thermoreflectance Microscopy and Multiparameter Fitting
,”
J. Appl. Phys.
,
86
, pp.
5314
–
5316
.
20.
Cahill
,
D. G.
,
Bullen
,
A.
, and
Lee
,
S.-M.
,
2000
, “
Interface Thermal Conductance and the Thermal Conductivity of Multilayer Thin Films
,”
High Temp. - High Press.
,
32
, pp.
135
–
142
.
21.
Lee
,
S.-M.
, and
Cahill
,
D. G.
,
1997
, “
Heat Transport in Thin Dielectric Films
,”
J. Appl. Phys.
,
81
, pp.
2590
–
2595
.
22.
Costescu
,
R. M.
,
Wall
,
M. A.
, and
Cahill
,
D. G.
,
2003
, “
Thermal Conductance of Epitaxial Interfaces
,”
Phys. Rev. B
,
67
, pp.
054302
1
.
23.
Smith, A. N., Caffrey, A. P., Klopf, M. J., and Norris, P. M., 2001, “Importance of Signal Phase on the Transient Thermoreflectance Response as a Thermal Sensor,” Proc. of the 35th National Heat Transfer Conference, ASME, New York, pp. NHTC01 11221 1–6.
24.
Capinski
,
W. S.
, and
Maris
,
H. J.
,
1996
, “
Improved Apparatus for Picosecond Pump-and-Probe Optical Measurements
,”
Rev. Sci. Instrum.
,
67
, pp.
2720
–
2726
.
25.
Qiu
,
T. Q.
, and
Tien
,
C. L.
,
1992
, “
Short-Pulse Laser Heating of Metals
,”
Int. J. Heat Mass Transfer
,
35
, pp.
719
–
726
.
26.
Smith
,
A.
,
Hostetler
,
J. L.
, and
Norris
,
P. M.
,
2000
, “
Thermal Boundary Resistance Measurements Using a Transient Thermoreflectance Technique
,”
Microscale Thermophys. Eng.
,
4
, pp.
51
–
60
.
27.
Kittel, C., 1996, Introduction to Solid State Physics, 7th ed., Wiley, New York.
28.
Fugate
,
R. Q.
, and
Swenson
,
C. A.
,
1969
, “
Specific Heat of Al2O3 From 2 to 25 K
,”
J. Appl. Phys.
,
40
, pp.
3034
–
3036
.
29.
Levinshtein, M. E., Rumyantsev, S. L., and Shur, M. S., eds., 2001, Properties of Advanced Semiconductor Materials: GaN, AlN, InN, BN, SiC, SiGe, Wiley-Interscience, New York, p. 216.
30.
Franciosi
,
A.
,
Peterman
,
D. J.
,
Weaver
,
J. H.
, and
Moruzzi
,
V. L.
,
1982
, “
Structural Morphology and Electronic Properties of the Si–Cr Interface
,”
Phys. Rev. B
,
25
, pp.
4981
–
4993
.
31.
Hiraki
,
A.
,
Shuto
,
S.
,
Kim
,
S.
,
Kammura
,
W.
, and
Iwami
,
M.
,
1977
, “
Room-Temperature Interfacial Reaction in Au-Semiconductor
,”
Appl. Phys. Lett.
,
31
, pp.
611
–
612
.
32.
Touloukian, Y. S., 1970, Thermophysical Properties of Matter, Plenum, New York.
33.
Majumdar
,
A.
, and
Reddy
,
P.
,
2004
, “
Role of Electron-Phonon Coupling in Thermal Conductance of Metal-Nonmetal Interfaces
,”
Appl. Phys. Lett.
,
84
, pp.
4768
–
4770
.
34.
Kosevich
,
Y. A.
,
1995
, “
Fluctuation Subharmonic and Multiharmonic Phonon Transmission and Kapitza Conductance Between Crystals With Very Different Vibrational Spectra
,”
Phys. Rev. B
,
52
, pp.
1017
–
1024
.
35.
Sergeev
,
A.
,
1999
, “
Inelastic Electron-Boundary Scattering in Thin Films
,”
Physica B
,
263
, pp.
217
–
219
.
36.
Sergeev
,
A. V.
,
1998
, “
Electronic Kapitza Conductance Due to Inelastic Electron-Boundary Scattering
,”
Phys. Rev. B
,
58
, pp.
10199
–
10202
.
37.
Huberman
,
M. L.
, and
Overhauser
,
A. W.
,
1994
, “
Electronic Kapitza Conductance at a Diamond-Pb Interface
,”
Phys. Rev. B
,
50
, pp.
2865
–
2873
.
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