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Keywords: voiding
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Journal Articles
Publisher: ASME
Article Type: Research-Article
J. Electron. Packag. September 2025, 147(3): 031001.
Paper No: EP-24-1090
Published Online: March 14, 2025
...-based convolutional neural network (RCNN) model’s accuracy in analyzing asymmetrical, large-amount ball grid array (BGA) flip-chip underfilling void formation and its size relative to the underfill region. Experimental images of the through-scan acoustic microscope (TSAM) of BGA underfill are collected...