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Keywords: Shear Cycle Test andClose
Journal: Journal of Electronic Packaging
Article Type: Papers On Reliability
J. Electron. Packag. September 2001, 123(3): 290–294.
Published Online: July 14, 1999
... view (SEM) of crack in a failed solder joint 5 SEM cross-sectional view of initial crack near PCB solder pad Figure 5 is the initial crack cross-section SEM image of solder joint caused by shear cycling test. Figure 6 is a typical developed crack cross-section SEM view of a failed...