1-8 of 8
Topology
Close
Save search
Follow your search
Access your saved searches in your account
Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Journal Articles

Heat Dissipation Design Based on Topology Optimization and Auxiliary Materials

Available to Purchase
Jiawei Chen, Zhongming Yan, Yang Qiao, Feihong Lin, Yu Wang, Hongcheng Zhou
Journal: Journal of Electronic Packaging
Publisher: ASME
Article Type: Research-Article
J. Electron. Packag. June 2024, 146(2): 021011.
Paper No: EP-23-1062
https://doi.org/10.1115/1.4064099
Published Online: December 11, 2023
View Articletitled, Heat Dissipation Design Based on Topology Optimization and Auxiliary Materials
Open the PDF for Heat Dissipation Design Based on Topology Optimization and Auxiliary Materials in another window
Topics: Energy dissipation, Heat, Topology optimization, Design, Density, Temperature, Topology, Phase change materials
Journal Articles

Numerical Analysis of Flow and Heat Transfer Characteristics of Lattice-Based Compact Heat Sinks

Available to Purchase
Inderjot Kaur, Shiraz Mujahid, YubRaj Paudel, Hongjoo Rhee, Prashant Singh
Journal: Journal of Electronic Packaging
Publisher: ASME
Article Type: Research-Article
J. Electron. Packag. September 2023, 145(3): 031002.
Paper No: EP-22-1051
https://doi.org/10.1115/1.4056305
Published Online: December 21, 2022
View Articletitled, Numerical Analysis of Flow and Heat Transfer Characteristics of Lattice-Based Compact Heat Sinks
Open the PDF for Numerical Analysis of Flow and Heat Transfer Characteristics of Lattice-Based Compact Heat Sinks in another window
Topics: Flow (Dynamics), Fluids, Heat transfer, Heat transfer coefficients, Topology, Temperature
Journal Articles

Thermomechanical Topology Optimization of Three-Dimensional Heat Guiding Structures for Electronics Packaging

Free
Shiva Farzinazar, Zongqing Ren, Jungyun Lim, Jae Choon Kim, Jaeho Lee
Journal: Journal of Electronic Packaging
Publisher: ASME
Article Type: Research-Article
J. Electron. Packag. June 2022, 144(2): 021118.
Paper No: EP-21-1038
https://doi.org/10.1115/1.4053948
Published Online: March 28, 2022
View Articletitled, Thermomechanical Topology Optimization of Three-Dimensional Heat Guiding Structures for Electronics Packaging
Open the PDF for Thermomechanical Topology Optimization of Three-Dimensional Heat Guiding Structures for Electronics Packaging in another window
Topics: Heat, Optimization, Thermomechanics, Topology, Design, Electronic packaging, Heat sinks
Journal Articles

Lid-Integral Cold-Plate Topology: Integration, Performance, and Reliability

Available to Purchase
Gerd Schlottig, Marco de Fazio, Werner Escher, Paola Granatieri, Vijayeshwar D. Khanna, Thomas Brunschwiler
Journal: Journal of Electronic Packaging
Publisher: ASME
Article Type: Research-Article
J. Electron. Packag. March 2016, 138(1): 010906.
Paper No: EP-15-1094
https://doi.org/10.1115/1.4032493
Published Online: March 10, 2016
View Articletitled, Lid-Integral Cold-Plate Topology: Integration, Performance, and Reliability
Open the PDF for Lid-Integral Cold-Plate Topology: Integration, Performance, and Reliability in another window
Topics: Gaskets, Geometry, Heat, Manifolds, Reliability, Silicon, Stress, Topology, Vehicles, Warping
Journal Articles

Optimization and Design of a Multipass Branching Microchannel Heat Sink for Electronics Cooling

Available to Purchase
Ercan M. Dede
Journal: Journal of Electronic Packaging
Publisher: ASME
Article Type: Research-Article
J. Electron. Packag. December 2012, 134(4): 041001.
https://doi.org/10.1115/1.4007159
Published Online: August 29, 2012
View Articletitled, Optimization and Design of a Multipass Branching Microchannel Heat Sink for Electronics Cooling
Open the PDF for Optimization and Design of a Multipass Branching Microchannel Heat Sink for Electronics Cooling in another window
Topics: Cooling, Design, Fluids, Optimization, Microchannels, Topology, Heat sinks, Temperature, Computer cooling, Heat transfer
Journal Articles

Development of Compact Models for Electronics Cooling: Using the Multigrid Operator to Generate Reduced-Order Description of Devices

Available to Purchase
Prabhu Sathyamurthy, Manoj Nagulapally, Rajesh Nair
Journal: Journal of Electronic Packaging
Publisher: ASME
Article Type: Research Papers
J. Electron. Packag. December 2004, 126(4): 472–476.
https://doi.org/10.1115/1.1827263
Published Online: January 24, 2005
View Articletitled, Development of Compact Models for Electronics Cooling: Using the Multigrid Operator to Generate Reduced-Order Description of Devices
Open the PDF for Development of Compact Models for Electronics Cooling: Using the Multigrid Operator to Generate Reduced-Order Description of Devices in another window
Topics: Capacitance, Computer cooling, Heat, Junctions, Linear systems, Simulation, Steady state, Temperature, Topology, Transients (Dynamics)
Journal Articles

In Situ Evaluation of Residual Stresses in an Organic Die-Attach Adhesive

Available to Purchase
A. S. Voloshin, P.-H. Tsao, R. A. Pearson
Journal: Journal of Electronic Packaging
Publisher: ASME
Article Type: Technical Briefs
J. Electron. Packag. September 1998, 120(3): 314–318.
https://doi.org/10.1115/1.2792639
Published Online: September 1, 1998
View Articletitled, In Situ Evaluation of Residual Stresses in an Organic Die-Attach Adhesive
Open the PDF for In Situ Evaluation of Residual Stresses in an Organic Die-Attach Adhesive in another window
Topics: Adhesives, Residual stresses, Epoxy adhesives, Epoxy resins, Stress, Hardening (Curing), Absorption, Cooling, Interferometry, Relaxation (Physics)
Journal Articles

Measurement of Wafer Surface Using Shadow Moire´ Technique With Talbot Effect

Available to Purchase
S. Wei, S. Wu, I. Kao, F. P. Chiang
Journal: Journal of Electronic Packaging
Publisher: ASME
Article Type: Special Section Technical Papers
J. Electron. Packag. June 1998, 120(2): 166–170.
https://doi.org/10.1115/1.2792612
Published Online: June 1, 1998
View Articletitled, Measurement of Wafer Surface Using Shadow Moire´ Technique With Talbot Effect
Open the PDF for Measurement of Wafer Surface Using Shadow Moire´ Technique With Talbot Effect in another window
Topics: Semiconductor wafers, Shades and shadows, Diffraction gratings, Diffraction patterns, Inspection, Resolution (Optics), Warping, Lasers, Light sources, Probes