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Issues
March 2007
ISSN 1043-7398
EISSN 1528-9044
In this Issue
Research Papers
Assessment of Some Integrated Cooling Mechanisms for an Active Integrated Power Electronics Module
J. Electron. Packag. March 2007, 129(1): 1–8.
doi: https://doi.org/10.1115/1.2429703
Topics:
Ceramics
,
Cooling
,
Electronics
,
Heat
,
Thermal conductivity
,
Temperature
,
Thermal management
Design Optimization and Reliability of PWB Level Electronic Package
J. Electron. Packag. March 2007, 129(1): 9–18.
doi: https://doi.org/10.1115/1.2429704
An Investigation of Stresses Induced by Temperature Variation in Integrated Circuit Molding Process
J. Electron. Packag. March 2007, 129(1): 19–27.
doi: https://doi.org/10.1115/1.2429705
Topics:
Molding
,
Stress
,
Temperature
Shorter Field Life in Power Cycling for Organic Packages
J. Electron. Packag. March 2007, 129(1): 28–34.
doi: https://doi.org/10.1115/1.2429706
Molecular Dynamics Simulation of Thermal Cycling Test in Electronic Packaging
J. Electron. Packag. March 2007, 129(1): 35–40.
doi: https://doi.org/10.1115/1.2429707
Topics:
Adhesion
,
Electronic packaging
,
Molecular dynamics simulation
,
Reliability
,
Epoxy resins
,
Simulation
,
Cycles
,
Copper
,
Molecular dynamics
Constitutive Modeling on Time-Dependent Deformation Behavior of Solder Alloy Under Cyclic Multiaxial Straining
J. Electron. Packag. March 2007, 129(1): 41–47.
doi: https://doi.org/10.1115/1.2429708
Topics:
Deformation
,
Modeling
,
Solders
,
Stress
,
Alloys
,
Tin
,
Constitutive equations
Effect of Test Conditions on Electromigration Reliability of Flip-Chip Solder Interconnects
J. Electron. Packag. March 2007, 129(1): 56–62.
doi: https://doi.org/10.1115/1.2429710
Topics:
Electrodiffusion
,
Flip-chip
,
Reliability
,
Solders
,
Tin
,
Current density
,
Temperature
,
Temperature distribution
Numerical Simulation of Laminar Flow and Heat Transfer Inside a Microchannel With One Dimpled Surface
J. Electron. Packag. March 2007, 129(1): 63–70.
doi: https://doi.org/10.1115/1.2429711
Topics:
Flow (Dynamics)
,
Heat transfer
,
Laminar flow
,
Microchannels
,
Microscale devices
,
Computer simulation
A Study of Deformation Mechanism During Nanoindentation Creep in Tin-Based Solder Balls
J. Electron. Packag. March 2007, 129(1): 71–75.
doi: https://doi.org/10.1115/1.2429712
Topics:
Creep
,
Nanoindentation
,
Solders
,
Stress
,
Deformation
,
Diffusion (Physics)
The Influence of Material Properties and Spreading Resistance in the Thermal Design of Plate Fin Heat Sinks
J. Electron. Packag. March 2007, 129(1): 76–81.
doi: https://doi.org/10.1115/1.2429713
Topics:
Design
,
Heat sinks
,
Thermal conductivity
,
Optimization
Experimental Observation of Correlation Between Creep and Uniaxial Ratchetting of and Solder Alloys
J. Electron. Packag. March 2007, 129(1): 82–89.
doi: https://doi.org/10.1115/1.2429714
Topics:
Alloys
,
Creep
,
Deformation
,
Lead-free solders
,
Solders
,
Stress
Multidisciplinary Placement Optimization of Heat Generating Electronic Components on Printed Circuit Boards
J. Electron. Packag. March 2007, 129(1): 90–97.
doi: https://doi.org/10.1115/1.2429715
Topics:
Genetic algorithms
,
Heat
,
Junctions
,
Optimization
,
Temperature
,
Electrical wires
,
Density
,
Artificial neural networks
,
Electronic components
Design Guideline for Ball Impact Test Apparatus
J. Electron. Packag. March 2007, 129(1): 98–104.
doi: https://doi.org/10.1115/1.2429716
Topics:
Brittleness
,
Design
,
Fracture (Process)
,
Impact testing
,
Reliability
,
Solder joints
,
Transients (Dynamics)
,
Damping
,
Structural dynamics
Research Papers
Flip-Chip Underfill Packaging Considering Capillary Force, Pressure Difference, and Inertia Effects
J. Electron. Packag. March 2007, 129(1): 48–55.
doi: https://doi.org/10.1115/1.2429709
Topics:
Flip-chip
,
Flow (Dynamics)
,
Inertia (Mechanics)
,
Packaging
,
Pressure
,
Rotation
,
Surface tension
Technical Brief
Investigations of Board-Level Drop Reliability of Wafer-Level Chip-Scale Packages
J. Electron. Packag. March 2007, 129(1): 105–108.
doi: https://doi.org/10.1115/1.2429717
Topics:
Reliability
,
Semiconductor wafers
,
Solder joints
,
Transient analysis
Book Reviews
Lead-Free Implementation and Production–A Manufacturing Guide
J. Electron. Packag. March 2007, 129(1): 109–110.
doi: https://doi.org/10.1115/1.2429719
Topics:
Manufacturing
,
Solders
Electrical Properties of Polymers
J. Electron. Packag. March 2007, 129(1): 111.
doi: https://doi.org/10.1115/1.2429720
Topics:
Electrical properties
,
Polymers
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