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Issues
June 2000
ISSN 1043-7398
EISSN 1528-9044
In this Issue
Technical Papers
Measurement of Dynamic Warpage During Thermal Cycling of Dielectric Coated SS Substrates for Large Area MCM-D Packaging
J. Electron. Packag. June 2000, 122(2): 77–85.
doi: https://doi.org/10.1115/1.483138
Topics:
Temperature
,
Warping
,
Stainless steel
A Study on Warpage of Flexible SS Substrates for Large Area MCM-D Packaging
J. Electron. Packag. June 2000, 122(2): 86–91.
doi: https://doi.org/10.1115/1.483152
Topics:
Warping
,
Coating processes
,
Packaging
,
Temperature
,
Shades and shadows
,
Stainless steel
Thermal Management Enhancement for GaAs Devices Using CVD Diamond Heat Spreaders in a Plastic Package Environment
J. Electron. Packag. June 2000, 122(2): 92–97.
doi: https://doi.org/10.1115/1.483139
Topics:
Gallium arsenide
,
Synthetic diamonds
,
Thermal management
,
Flat heat pipes
,
Packaging
Thermal Management Strategies for Embedded Electronic Components of Wearable Computers
J. Electron. Packag. June 2000, 122(2): 98–106.
doi: https://doi.org/10.1115/1.483140
Topics:
Computer simulation
,
Computers
,
Design
,
Electronics
,
Flat heat pipes
,
Heat
,
Polymer composites
,
Temperature
,
Thermal conductivity
,
Thermal management
A Numerical Study of the Thermal Performance of a Tape Ball Grid Array (TBGA) Package
J. Electron. Packag. June 2000, 122(2): 107–114.
doi: https://doi.org/10.1115/1.483141
Topics:
Ball-Grid-Array packaging
,
Heat sinks
,
Heat transfer
,
Junctions
,
Modeling
,
Natural convection
,
Radiation (Physics)
,
Solders
,
Temperature
,
Thermal conductivity
Thermal Placement Design for MCM Applications
J. Electron. Packag. June 2000, 122(2): 115–120.
doi: https://doi.org/10.1115/1.483142
Role of Out-of-Plane Coefficient of Thermal Expansion in Electronic Packaging Modeling
J. Electron. Packag. June 2000, 122(2): 121–127.
doi: https://doi.org/10.1115/1.483143
Topics:
Stress
,
Thermal expansion
,
Deformation
,
Electronic packaging
,
Plane strain
,
Modeling
Sodium Silicate Based Thermal Interface Material for High Thermal Contact Conductance
J. Electron. Packag. June 2000, 122(2): 128–131.
doi: https://doi.org/10.1115/1.483144
Topics:
Contact resistance
,
Particulate matter
,
Silicones
,
Sodium
,
Thermal conductivity
,
Boron
,
Water
,
Copper
,
Fillers (Materials)
,
Solders
Impinging Jet Boiling of a Fluorinert Liquid on a Foil Heater Array
J. Electron. Packag. June 2000, 122(2): 132–137.
doi: https://doi.org/10.1115/1.483145
Topics:
Boiling
,
Coolants
,
Critical heat flux
,
Flow (Dynamics)
,
Forced convection
,
Heat transfer
,
Strips
,
Subcooling
,
Temperature
,
Nozzles
Computational Modeling and Validation of the Encapsulation of Plastic Packages by Transfer Molding
J. Electron. Packag. June 2000, 122(2): 138–146.
doi: https://doi.org/10.1115/1.483146
Topics:
Cavities
,
Flow (Dynamics)
,
Molding
,
Pressure
,
Simulation
,
Temperature
,
Transfer molding
,
Viscosity
,
Computer simulation
,
Computer software
A Technique to Measure Interfacial Toughness Over a Range of Phase Angles
J. Electron. Packag. June 2000, 122(2): 147–151.
doi: https://doi.org/10.1115/1.483147
Topics:
Adhesives
,
Fracture (Materials)
,
Fracture mechanics
,
Fracture toughness
,
Stress
,
Finite element analysis
,
Testing
Multiobjective Optimal Placement of Convectively and Conductively Cooled Electronic Components on Printed Wiring Boards
J. Electron. Packag. June 2000, 122(2): 152–159.
doi: https://doi.org/10.1115/1.483148
Topics:
Electrical wires
,
Electronic components
,
Failure
,
Genetic algorithms
,
Heat
,
Heat transfer
,
Optimization
,
Pareto optimization
,
Printed circuit boards
,
Design
Flow Analysis in a Chip Cavity During Semiconductor Encapsulation
J. Electron. Packag. June 2000, 122(2): 160–167.
doi: https://doi.org/10.1115/1.483149
Topics:
Cavities
,
Cross-flow
,
Flow (Dynamics)
,
Molding
,
Epoxy adhesives
,
Epoxy resins
,
Semiconductors (Materials)
A Novel High Performance Die Attach for Ceramic Packages
J. Electron. Packag. June 2000, 122(2): 168–171.
doi: https://doi.org/10.1115/1.483150
Topics:
Bonding
,
Ceramics
,
Cycles
,
Shear strength
,
Solidification
,
Temperature
Nondestructive Evaluation of Ceramic Substrate With Embedded Passive Components by SAM
J. Electron. Packag. June 2000, 122(2): 172–177.
doi: https://doi.org/10.1115/1.483151
Topics:
Acoustics
,
Capacitors
,
Ceramics
,
Delamination
,
Nondestructive evaluation
,
Testing
,
Microscopy
,
Thermal shock
,
Reliability
,
Failure analysis
Book Review
Handbook of Electronic Package Design
J. Electron. Packag. June 2000, 122(2): 178–179.
doi: https://doi.org/10.1115/1.483153
Topics:
Design
,
Electronic packages
,
Thermal management
,
Printed circuit boards
,
Packaging
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Optimization of Micro-Pillars Electroplating Bonding Processes and Additives
J. Electron. Packag
Microbead Encapsulation for Protection of Electronic Components
J. Electron. Packag
Performance Analysis of a Brazed Plate Heat Exchanger During Condensation of R1233zd(E)
J. Electron. Packag (June 2025)
Wideband Equivalent Circuit Modeling and Parameter Extraction Method for Through Via in Ceramic Package Substrate
J. Electron. Packag (June 2025)