Skip Nav Destination
Issues
June 1997
ISSN 1043-7398
EISSN 1528-9044
In this Issue
Technical Papers
The Effects of Strain Rate and Thickness on the Response of Thin Layers of Solder Loaded in Pure Shear
J. Electron. Packag. June 1997, 119(2): 81–84.
doi: https://doi.org/10.1115/1.2792223
Topics:
Shear (Mechanics)
,
Solders
,
Deformation
,
Stress
,
Ductility
,
Shear stress
,
Stress-strain curves
,
Testing
,
Tin
Moisture Migration and Cracking in Plastic Quad Flat Packages (PQFPs)
J. Electron. Packag. June 1997, 119(2): 85–88.
doi: https://doi.org/10.1115/1.2792224
Topics:
Acoustics
,
Computers
,
Cracking (Materials)
,
Equilibrium (Physics)
,
Fracture (Process)
,
Heat
,
Heating
,
High temperature
,
Lumber
,
Microscopy
Uniform Channel Micro Heat Exchangers
J. Electron. Packag. June 1997, 119(2): 89–94.
doi: https://doi.org/10.1115/1.2792225
Combined Pressure and Subcooling Effects on Pool Boiling From a PPGA Chip Package
J. Electron. Packag. June 1997, 119(2): 95–105.
doi: https://doi.org/10.1115/1.2792226
Topics:
Pool boiling
,
Pressure
,
Subcooling
,
Critical heat flux
,
Boiling
,
Nucleate pool boiling
Optimal Three-Dimensional Placement of Heat Generating Electronic Components
J. Electron. Packag. June 1997, 119(2): 106–113.
doi: https://doi.org/10.1115/1.2792210
Topics:
Electronic components
,
Heat
,
Algorithms
,
Simulated annealing
,
Computers
,
Heat transfer
,
Temperature
Effect of Load-Mix on Fatigue Crack Growth in 63Sn-37Pb Solder Joints
J. Electron. Packag. June 1997, 119(2): 114–118.
doi: https://doi.org/10.1115/1.2792212
Topics:
Fatigue cracks
,
Solder joints
,
Stress
,
Tin
,
Shear (Mechanics)
,
Solders
Finite Element Modeling of Three-Dimensional Solder Joint Geometry in SMT
J. Electron. Packag. June 1997, 119(2): 119–126.
doi: https://doi.org/10.1115/1.2792214
Topics:
Finite element analysis
,
Geometry
,
Modeling
,
Solder joints
,
Bricks
,
Electronic packaging
,
Equilibrium (Physics)
,
Shapes
,
Soldering
,
Surface mount packaging
Thermal Stresses in Layered Electronic Assemblies
J. Electron. Packag. June 1997, 119(2): 127–132.
doi: https://doi.org/10.1115/1.2792218
Thermomechanical Mechanism for Delamination of Polymer Coatings From Optical Fibers
J. Electron. Packag. June 1997, 119(2): 133–137.
doi: https://doi.org/10.1115/1.2792219
Topics:
Coatings
,
Delamination
,
Optical fiber
,
Polymers
,
Thermomechanics
,
Tension
,
Fibers
,
Compressive stress
,
Composite materials
,
Hydrostatics
Solid Model Based Preprocessor to CFD Code for Applications to Electronic Cooling Systems
J. Electron. Packag. June 1997, 119(2): 138–143.
doi: https://doi.org/10.1115/1.2792220
Book Reviews
Plastic Encapsulated Microelectronics; Materials, Processes, Quality, Reliability, and Application
Michael G. Pecht, Editor, Luu T. Nguyen, Editor, Edward B. Hakim, Editor, Anthony J. Rafanelli, Reviewer
J. Electron. Packag. June 1997, 119(2): 144–145.
doi: https://doi.org/10.1115/1.2792221
Topics:
Microelectronic devices
,
Reliability
Long-Term Non-Operating Reliability of Electronic Products
J. Electron. Packag. June 1997, 119(2): 145–146.
doi: https://doi.org/10.1115/1.2792222
Topics:
Electronic products
,
Reliability
Email alerts
RSS Feeds
Enhancing Image Segmentation Model in Computing Void Percentage With Mask RCNN
J. Electron. Packag (September 2025)
Sub-millimeter Reflector for Edge-Emitting Laser Package
J. Electron. Packag