This work examines the mechanical performance of thin film coatings from Photosensitive-benzocyclobutene (Photo-BCB) formulations (Cyclotene2 4024, 4026 and 7200), on various substrate surfaces such as Al, Cu, Si, and SiN. The adhesion promoter used was designated AP-3000 and was based on vinyltriacetoxysilane (VTAS), which had been properly hydrolyzed and advanced. Measurement of the interfacial adhesion was performed primarily using the modified Edge Liftoff Test m-ELT. It was found that, by applying the newly developed adhesion promoter, AP-3000, the interfacial energy of Photo-BCB to Al, Cu, Si, and SiN was significantly improved, often approaching the toughness of Photo-BCB, ca. 45 J/m2. The x-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM) analyses of the delaminated surfaces of the Photo-BCB/Al structure revealed distinct differences in surface roughness and the chemical composition depending on whether or not adhesion promoter was used. Other parameters important for long term stability (e.g., moisture uptake and thermal stability) of Photo-BCB were also measured. The equilibrium moisture content at 84 percent RH in ambient temperature was low, 0.14 wt percent and the thermally induced weight loss at 330°C in helium atmosphere was less than 1 percent/h. The low moisture absorption and good thermal stability, together with the given mechanical toughness and adhesion, allow the Photo-BCB to be widely usable for various microelectronic packaging applications, for up to 40 μm thick build in the case of silicon substrate. [S1043-7398(00)00701-5]

1.
Elenius, P., Janssen, R., and Strandjord, A. J. G., 1997, “Bumping Redistribution Using BCB” Proceedings of Semicon West.
2.
Mis, J., Rinne, G., Deane, P., and Adema, G., 1996, “Flip Chip Production Experience: Some Design, Process, Reliability and Cost Considerations,” Proceedings of ISHM, Minneapolis, MN, pp. 291–295.
3.
Simon, J., Toepper, M., and Reichl, H., 1995, “A Comparison of Flip Chip Technology With Chip Size Packages,” Proceedings of IEPS, San Diego, CA, pp. 665–674.
4.
Clearfield, H., M., Wijeyesekera, S., Logan, E. A., Luu, A., Gieser, D., Lin, C.-M., Jing, J., Rogers, W. B., Scheck, D., Benson, D., and He, J., 1998, “Integrated Passive Devices using AI/BCB Thin Films,” Proceedings of the International Conference on Multichip Modules and High Density Packaging, Denver, CO, pp. 501–505.
5.
Rogers, B., Scheck, D., Garrou, P., Strandjord, A., DeVellis, B., Moyer, E., Ida, Y., and Shiau, S., 1997, “Single Mask Stress Buffer,” Proceedings of the International Symposium on Advanced Packaging Materials. Braselton, GA, pp. 15–18.
6.
Strandjord, A., DeVellis, R., Rogers, W., Garrou, P., Moyer, E., and Becker, G., 1996, “Photosensitive Benzocyclobutene for Stress-Buffer and Passivation Applications (Optical and Photolithographic Properties),” Cost Effective Lithography Symposium, San Francisco, CA, Semicon West, pp. 1–15.
7.
Garrou
,
P.
,
1992
, “
Polymeric Dielectrics for Multichip Module Packaging
,”
Proc. of IEEE
,
80
, No.
12
, pp.
1942
1954
.
8.
Skinner
,
M.
,
Castillo
,
D.
,
Garrou
,
P.
,
Rogers
,
B.
,
Chazan
,
D.
,
Liu
,
K.
,
Reinschmidt
,
R.
,
Westbrook
,
S.
, and
Ho
,
C.
,
1996
, “
Twinstar—Dual Pentium(c) Processor Module
,”
Int. J. Microcircuits and Electronic Packaging
,
19
, No.
4
pp.
358
363
.
9.
Wells, G. T., Chau, C. C., Garrou, P., Heistand, R., Cummings, S., Rehg, T., Ho, C., Chieh, E., Gibson, G., Newquist, C., Kruzek, R., Ellec, C., and Vogt, L., 1996, “Consortium for Intelligent Large Area Processing,” Proceedings of ISHM, Minneapolis, MN, pp. 397–402.
10.
Shimoto
,
T.
,
Matsui
,
K.
, and
Utsumi
,
K.
,
1995
, “
Cu/Photo-Sensitive-BCB Thin Film Multilayer Technology for High Performance. Multichip Modules
,”
IEEE Trans. Compon., Packag. Manuf. Technol., Part B
,
18
, No.
1
pp.
18
22
.
11.
Mittal
,
K. L.
,
1987
, “
Selected Bibliography on Adhesion Measurement of Films and Coatings
,”
J. Adhes. Sci. Technol.
,
1
, No.
3
pp.
247
259
.
12.
Mittal
,
K. L.
,
1976
, “
Adhesion Measurements on Thin Films
,”
Electrocomponent Sci. & Tech.
,
3
, pp.
21
42
.
13.
Conway
,
H. D.
, and
Thomsin
,
J. R.
,
1988
, “
The Determination of Bond Strength of Polymeric Films by Indentation Debonding
,”
J. Adhes. Sci. Technol.
,
2
, No.
3
pp.
227
236
.
14.
Marshall
,
D. B.
, and
Evans
,
A. G.
,
1984
, “
Measurement of Adherence of Residually Stressed Thin Films by Indentation: I—Mechanics of Interface Delamination
,”
J. Appl. Phys.
,
56
, No.
10
pp.
2632
2638
.
15.
Townsend
,
P. H.
,
Schmidt
,
D.
,
Stokich
,
T. M.
,
Kisting
,
S.
,
Burdeaux
,
D. C.
,
Frye
,
D.
,
Bernius
,
M.
,
Lanka
,
M.
, and
Berry
,
K.
,
1993
, “
Adhesion of Cyclotene™ Coatings on Silicone Substrates
,”
Proc. MRS
,
323
, pp.
365
370
.
16.
Suo
,
Z.
, and
Hutchinson
,
J. W.
,
1990
, “
Interface Crack Between Two Elastic Layers
,”
Int. J. Fract.
,
43
, pp.
1
18
.
17.
Ye
,
T.
,
Suo
,
Z.
, and
Evans
,
A. G.
,
1992
, “
Thin Film Cracking and the Roles of Substrate and Interface
,”
Int. J. Solids Struct.
,
29
, No.
21
pp.
2639
2648
.
18.
Jansen
,
H.
,
Hutchinson
,
J. W.
, and
Kim
,
K. S.
,
1990
, “
Decohesion of a Cut Prestressed Film on a Substrate
,”
Int. J. Solids Struct.
,
26
, pp.
1009
1114
.
19.
Ma
,
Q.
,
Bumgarner
,
J.
,
Fujimoto
,
H.
,
Lane
,
M.
, and
Dauskard
,
R. H.
,
1997
, “
Adhesion Measurement of Interfaces in Multilayer Interconnect Structures
,”
Proc. MRS
,
473
, pp.
3
14
.
20.
Snodgrass, J. M., Kook, S.-Y., Kirtikar, A., and Dauskardt, R. H., 1997, “Adhesion and Reliability of Polymer/Inorganic Interfaces in Microelectronic Applications,” Application of Fracture Mechanics in Electronic PKG, W. T. Chen, D. T. Read, eds., ASME, New York, pp. 33–40.
21.
Shaffer
, II,
E. O.
,
Hoang
,
L.
, and
McGarry
,
F. J.
,
1996
, “
Edge Liftoff: A New Test for Adhesion
,”
Polym. Sci. & Eng.
,
36
, No.
18
pp.
2375
2381
.
22.
Shaffer II, E. O., Townsend, P. H., and Im, J., 1996, “Measuring and Predicting the Reliability of Low-k Polymeric Dielectric Materials,” Proceedings of MRS, Advanced Metals and Interconnect Systems for ULSI, O. Havemann, ed., Boston, MA, pp. 429–435.
23.
Shaffer II, E. O., Mills, M. E., Hawn, D., Van Gestel, M., Knorr, A., Gundlach, H., Kumar, K., Kaloyeros, A. E., and Gerr, R. E., 1998, “Adhesion Energy Measurements of Multilayer Low-k Dielectric Materials for ULSI Applications,” Proceedings of MRS, San Francisco, CA.
24.
Moyer
,
E.
,
Rutter
,
E.
,
Bernius
,
M.
,
Townsend
,
P.
,
Harris
,
R.
,
Projanto
,
H.
, and
Denton
,
D.
,
1992
, “
Phtodefinable BCB Formulations for Thin Film Microelectronic Applications: Part II
,”
Proc. IEPS
,
1
, pp.
37
50
.
25.
Strandjord, A. J. G., Ida, Y., Garrou, P., Rogers, W. B., Cummings, S., and Kisting, S., 1995, “MCM-D Fabrication With Photosensitive Benzocyclobutene: (Processing, Solder Bumping, Systems Assembly, and Testing).” Proceedings ISHM, Los Angeles, CA, pp. 402–417.
26.
Strandjord
,
A. J. G.
,
Scheck
,
D.
,
Kisting
,
S. R.
,
Rogers
,
W. B.
,
Garrou
,
P. E.
,
Ida
,
Y.
, and
Cummings
,
S. L.
,
1996
, “
Process Optimization and Systems Integration of a Cu/Photosensitive Benzocyclobutene MCM-D: Dielectric Processing, Metallization, Solder Bumping, Device Assembly and Testing
,”
Int. J. Microcircuits and Electronic Packaging
,
19
, pp.
260
280
.
27.
Gong
,
J.
,
Strandberg
,
F.
,
Theide
,
H.
,
Hentzell
,
H.
,
Hesselbloom
,
H.
, and
Karner
,
W.
,
1993
, “
Investigation of High Speed Pulse Transmission in MCM-D
,”
IEEE Trans. On CHMT
,
16
, pp.
735
742
.
28.
Im J., Shaffer II, E. O., Peters, R., Rey, T., Murlick, C., Sammler, R. L., 1996, “Physical and Mechanical Properties Determination of Photo-BCB-Based Thin Films,” Proceedings of ISHM, Minneapolis, MN, pp. 168–175.
29.
Pranjoto
,
H.
, and
Denton
,
D.
,
1990
, “
Moisture Uptake in BCB Films for Electronic Packaging Applications
,”
Proc. MRS
,
203
, pp.
295
302
.
30.
Heistand II, R., DeVellis, R., Garrou, P., Burdeaux, D., Stokich J., T., Townsend, P. Manial, T., Bratton, L., Davis, F., Berry, K., Highstreet, K., Lanka, M., and Tozer, M., 1992, “Cyclotene 3022 (BCB) for Non-Hermetic Packaging,” Proceedings of ISHM, pp. 584–590.
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