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Journal Articles

Adhesion and Friction Coupling in Atomic Force Microscope-Based Nanopushing

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Fakhreddine Landolsi, Fathi H. Ghorbel, James B. Dabney
Journal: Journal of Dynamic Systems, Measurement, and Control
Publisher: ASME
Article Type: Research-Article
J. Dyn. Sys., Meas., Control. January 2013, 135(1): 011002.
Paper No: DS-09-1341
https://doi.org/10.1115/1.4006370
Published Online: October 30, 2012
View Articletitled, Adhesion and Friction Coupling in Atomic Force Microscope-Based Nanopushing
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Topics: Adhesion, Atomic force microscopy, Friction, Nanoscale phenomena
Journal Articles

Response Measurement Accuracy for Off-Resonance Excitation in Atomic Force Microscopy

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R. Parker Eason, Andrew J. Dick
Journal: Journal of Dynamic Systems, Measurement, and Control
Publisher: ASME
Article Type: Research Papers
J. Dyn. Sys., Meas., Control. January 2012, 134(1): 011010.
https://doi.org/10.1115/1.4005361
Published Online: December 5, 2011
View Articletitled, Response Measurement Accuracy for Off-Resonance Excitation in Atomic Force Microscopy
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Topics: Accuracy and precision, Atomic force microscopy, Displacement, Errors, Excitation, Probes, Resonance, Calibration, Lasers, Displacement measurement
Journal Articles

Special Issue on Dynamic Modeling, Control and Manipulation at the Nanoscale

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Nader Jalili, Laxman Saggere, Arvind Raman
Journal: Journal of Dynamic Systems, Measurement, and Control
Publisher: ASME
Article Type: Guest Editorial
J. Dyn. Sys., Meas., Control. November 2009, 131(6): 060301.
https://doi.org/10.1115/1.4000554
Published Online: November 10, 2009
View Articletitled, Special Issue on Dynamic Modeling, Control and Manipulation at the Nanoscale
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Topics: Atomic force microscopy, Control modeling, Dynamic modeling, Nanoscale phenomena, Scanning probe microscopy, Modeling, Manipulators, Nanoelectromechanical devices
Journal Articles

DMCMN: In Depth Characterization and Control of AFM Cantilevers With Integrated Sensing and Actuation

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Georg E. Fantner, Daniel J. Burns, Angela M. Belcher, Ivo W. Rangelow, Kamal Youcef-Toumi
Journal: Journal of Dynamic Systems, Measurement, and Control
Publisher: ASME
Article Type: Dynamic Modeling Control And Manipulation At The Nanoscale
J. Dyn. Sys., Meas., Control. November 2009, 131(6): 061104.
https://doi.org/10.1115/1.4000378
Published Online: November 6, 2009
View Articletitled, DMCMN: In Depth Characterization and Control of AFM Cantilevers With Integrated Sensing and Actuation
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Topics: Actuators, Atomic force microscopy, Cantilevers, Deflection, Imaging
Journal Articles

An Iterative-Based Feedforward-Feedback Control Approach to High-Speed Atomic Force Microscope Imaging

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Ying Wu, Qingze Zou
Journal: Journal of Dynamic Systems, Measurement, and Control
Publisher: ASME
Article Type: Dynamic Modeling Control And Manipulation At The Nanoscale
J. Dyn. Sys., Meas., Control. November 2009, 131(6): 061105.
https://doi.org/10.1115/1.4000137
Published Online: November 6, 2009
View Articletitled, An Iterative-Based Feedforward-Feedback Control Approach to High-Speed Atomic Force Microscope Imaging
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Topics: Atomic force microscopy, Feedback, Imaging, Iterative learning control, Errors, Feedforward control, Design
Journal Articles

Towards Automated Nanoassembly With the Atomic Force Microscope: A Versatile Drift Compensation Procedure

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Florian Krohs, Cagdas Onal, Metin Sitti, Sergej Fatikow
Journal: Journal of Dynamic Systems, Measurement, and Control
Publisher: ASME
Article Type: Dynamic Modeling Control And Manipulation At The Nanoscale
J. Dyn. Sys., Meas., Control. November 2009, 131(6): 061106.
https://doi.org/10.1115/1.4000139
Published Online: November 6, 2009
View Articletitled, Towards Automated Nanoassembly With the Atomic Force Microscope: A Versatile Drift Compensation Procedure
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Topics: Algorithms, Atomic force microscopy, Filters, Particulate matter, Sensors, Uncertainty, Displacement
Journal Articles

Modeling Piezoresponse Force Microscopy for Low-Dimensional Material Characterization: Theory and Experiment

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Amin Salehi-Khojin, Saeid Bashash, Nader Jalili, Gary Lee Thompson, Alexey Vertegel
Journal: Journal of Dynamic Systems, Measurement, and Control
Publisher: ASME
Article Type: Dynamic Modeling Control And Manipulation At The Nanoscale
J. Dyn. Sys., Meas., Control. November 2009, 131(6): 061107.
https://doi.org/10.1115/1.4000161
Published Online: November 6, 2009
View Articletitled, Modeling Piezoresponse Force Microscopy for Low-Dimensional Material Characterization: Theory and Experiment
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Topics: Differential equations, Elastic constants, Frequency response, Microscopy, Modal analysis, Modeling, Parameter estimation, Piezoelectric materials, Stiffness, Resonance
Journal Articles

Design and Analysis of Discrete-Time Repetitive Control for Scanning Probe Microscopes

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Ugur Aridogan, Yingfeng Shan, Kam K. Leang
Journal: Journal of Dynamic Systems, Measurement, and Control
Publisher: ASME
Article Type: Dynamic Modeling Control And Manipulation At The Nanoscale
J. Dyn. Sys., Meas., Control. November 2009, 131(6): 061103.
https://doi.org/10.1115/1.4000068
Published Online: October 30, 2009
View Articletitled, Design and Analysis of Discrete-Time Repetitive Control for Scanning Probe Microscopes
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Topics: Atomic force microscopy, Control equipment, Design, Errors, Feedback, Imaging, Stability, Scanning probe microscopy, Robustness, Simulation
Journal Articles

DMCMN: Experimental/Analytical Evaluation of the Effect of Tip Mass on Atomic Force Microscope Cantilever Calibration

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Matthew S. Allen, Hartono Sumali, Peter C. Penegor
Journal: Journal of Dynamic Systems, Measurement, and Control
Publisher: ASME
Article Type: Technical Briefs
J. Dyn. Sys., Meas., Control. November 2009, 131(6): 064501.
https://doi.org/10.1115/1.4000160
Published Online: October 30, 2009
View Articletitled, DMCMN: Experimental/Analytical Evaluation of the Effect of Tip Mass on Atomic Force Microscope Cantilever Calibration
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Topics: Atomic force microscopy, Calibration, Cantilevers, Probes, Errors, Elastic constants, Mode shapes, Stiffness, Density
Journal Articles

A New Approach to Scan-Trajectory Design and Track: AFM Force Measurement Example

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Kyong-Soo Kim, Qingze Zou, Chanmin Su
Journal: Journal of Dynamic Systems, Measurement, and Control
Publisher: ASME
Article Type: Research Papers
J. Dyn. Sys., Meas., Control. September 2008, 130(5): 051005.
https://doi.org/10.1115/1.2936841
Published Online: August 1, 2008
View Articletitled, A New Approach to Scan-Trajectory Design and Track: AFM Force Measurement Example
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Topics: Adhesion, Atomic force microscopy, Design, Dynamics (Mechanics), Errors, Oscillations, Trajectories (Physics), Piezoelectric actuators, Force measurement, Algorithms
Journal Articles

Reduced Order Model Analysis for Two-Dimensional Molecular Dynamic Chain Structure Attached to an Atomic Force Microscope

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Deman Tang, Earl H. Dowell
Journal: Journal of Dynamic Systems, Measurement, and Control
Publisher: ASME
Article Type: Technical Papers
J. Dyn. Sys., Meas., Control. September 2004, 126(3): 531–546.
https://doi.org/10.1115/1.1789969
Published Online: December 3, 2004
View Articletitled, Reduced Order Model Analysis for Two-Dimensional Molecular Dynamic Chain Structure Attached to an Atomic Force Microscope
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Topics: Atomic force microscopy, Chain, Dynamic response, Equilibrium (Physics), Excitation, Linear systems, Proteins, Errors
Journal Articles

Dynamic Responses of an Atomic Force Microscope Interacting with Samples

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Jih-Lian Ha, Rong-Fong Fung, Yi-Chan Chen
Journal: Journal of Dynamic Systems, Measurement, and Control
Publisher: ASME
Article Type: Technical Briefs
J. Dyn. Sys., Meas., Control. December 2005, 127(4): 705–709.
https://doi.org/10.1115/1.2101851
Published Online: October 17, 2004
View Articletitled, Dynamic Responses of an Atomic Force Microscope Interacting with Samples
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Topics: Atomic force microscopy, Cantilever beams, Dynamic response, Deformation, Hamilton's principle, Piezoelectric actuators
Journal Articles

A Fresh Insight Into the Microcantilever-Sample Interaction Problem in Non-Contact Atomic Force Microscopy

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Nader Jalili, Mohsen Dadfarnia, Darren M. Dawson
Journal: Journal of Dynamic Systems, Measurement, and Control
Publisher: ASME
Article Type: Technical Papers
J. Dyn. Sys., Meas., Control. June 2004, 126(2): 327–335.
https://doi.org/10.1115/1.1767852
Published Online: August 5, 2004
View Articletitled, A Fresh Insight Into the Microcantilever-Sample Interaction Problem in Non-Contact Atomic Force Microscopy
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Topics: Atomic force microscopy, Modeling
Journal Articles

Optimal Control of Arrays of Microcantilevers

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Mariateresa Napoli, Bassam Bamieh, Mohammed Dahleh
Journal: Journal of Dynamic Systems, Measurement, and Control
Publisher: ASME
Article Type: Technical Papers
J. Dyn. Sys., Meas., Control. December 1999, 121(4): 686–690.
https://doi.org/10.1115/1.2802535
Published Online: December 1, 1999
View Articletitled, Optimal Control of Arrays of Microcantilevers
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Topics: Microcantilevers, Optimal control, Control equipment, Sensors, Actuators, Atomic force microscopy, Design, Manufacturing, Nanoscale phenomena
Journal Articles

Creep, Hysteresis, and Vibration Compensation for Piezoactuators: Atomic Force Microscopy Application

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D. Croft, G. Shed, S. Devasia
Journal: Journal of Dynamic Systems, Measurement, and Control
Publisher: ASME
Article Type: Technical Papers
J. Dyn. Sys., Meas., Control. March 2001, 123(1): 35–43.
https://doi.org/10.1115/1.1341197
Published Online: November 19, 1999
View Articletitled, Creep, Hysteresis, and Vibration Compensation for Piezoactuators: Atomic Force Microscopy Application
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Topics: Atomic force microscopy, Creep, Modeling, Vibration, Dynamics (Mechanics), Scanning probe microscopy
Journal Articles

Complex Dynamics in a Harmonically Excited Lennard-Jones Oscillator: Microcantilever-Sample Interaction in Scanning Probe Microscopes

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M. Basso, L. Giarre´, M. Dahleh, I. Mezic´
Journal: Journal of Dynamic Systems, Measurement, and Control
Publisher: ASME
Article Type: Technical Briefs
J. Dyn. Sys., Meas., Control. March 2000, 122(1): 240–245.
https://doi.org/10.1115/1.482465
Published Online: January 30, 1998
View Articletitled, Complex Dynamics in a Harmonically Excited Lennard-Jones Oscillator: Microcantilever-Sample Interaction in Scanning Probe Microscopes
Open the PDF for Complex Dynamics in a Harmonically Excited Lennard-Jones Oscillator: Microcantilever-Sample Interaction in Scanning Probe Microscopes in another window
Topics: Atomic force microscopy, Attractors, Dynamics (Mechanics), Scanning probe microscopy, Numerical analysis, Lennard-Jones potential, Dimensions, Chaos
Journal Articles

Study on a Surface-Motor Driven Precise Positioning System

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Yoshiyuki Tomita, Yasushi Koyanagawa
Journal: Journal of Dynamic Systems, Measurement, and Control
Publisher: ASME
Article Type: Technical Papers
J. Dyn. Sys., Meas., Control. September 1995, 117(3): 311–319.
https://doi.org/10.1115/1.2799121
Published Online: September 1, 1995
View Articletitled, Study on a Surface-Motor Driven Precise Positioning System
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Topics: Motors, Atomic force microscopy, Air bearings, Degrees of freedom, Design, Feedback, Interferometers, Lasers, Permeability, Resolution (Optics)