Pump-probe transient thermoreflectance (TTR) techniques are powerful tools for measuring thermophysical properties of thin films, such as thermal conductivity, Λ, or thermal boundary conductance, G. This paper examines the assumption of one-dimensional heating on Λ and G determination in nanostructures using a pump-probe transient thermoreflectance technique. The traditionally used one dimensional and radial (3D) models are reviewed. To test the assumptions of the thermal models, experimental data from Al films on bulk substrates (Si and glass) are taken with the TTR technique. This analysis is extended to thin film multilayer structures. Results show that at 11 MHz modulation frequency, thermal transport is indeed one dimensional. Error among the various models arises due to pulse accumulation and not accounting for residual heating.
Dimensionality Analysis of Thermal Transport in Multilayer Thin Film Systems
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Hopkins, PE, Serrano, JR, Phinney, LM, Kearney, SP, Grasser, TW, & Harris, CT. "Dimensionality Analysis of Thermal Transport in Multilayer Thin Film Systems." Proceedings of the ASME 2009 International Mechanical Engineering Congress and Exposition. Volume 12: Micro and Nano Systems, Parts A and B. Lake Buena Vista, Florida, USA. November 13–19, 2009. pp. 993-1001. ASME. https://doi.org/10.1115/IMECE2009-12238
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